N. Bertrand, B. Drévillon, A. Gheorghiu, C. Sénémaud, Ludvik Martinu and Jolanta-Ewa Sapieha
Article (1998)
An external link is available for this itemAdditional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
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Department: | Department of Engineering Physics |
PolyPublie URL: | https://publications.polymtl.ca/29841/ |
Journal Title: | Journal of vacuum science and technology. A, Vacuum, surfaces, and films (vol. 16, no. 1) |
Publisher: | American Vacuum Society |
DOI: | 10.1116/1.581013 |
Official URL: | https://doi.org/10.1116/1.581013 |
Date Deposited: | 18 Apr 2023 15:22 |
Last Modified: | 08 Apr 2025 02:20 |
Cite in APA 7: | Bertrand, N., Drévillon, B., Gheorghiu, A., Sénémaud, C., Martinu, L., & Sapieha, J.-E. (1998). Adhesion improvement of plasma-deposited silica thin films on stainless steel substrate studied by x-ray photoemission spectroscopy and in situ infrared ellipsometry. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 16(1), 6-12. https://doi.org/10.1116/1.581013 |
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