Yvon Savaria
, C. Thibeault and A. Ivanov
Article (1996)
This item is not archived in PolyPublie
| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
|---|---|
| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/30892/ |
| Journal Title: | IEEE Design & Test of Computers (vol. 13, no. 3) |
| Date Deposited: | 18 Apr 2023 15:24 |
| Last Modified: | 25 Sep 2024 16:12 |
| Cite in APA 7: | Savaria, Y., Thibeault, C., & Ivanov, A. (1996). IEEE VSLI test symposium - meeting the quality challenge. IEEE Design & Test of Computers, 13(3), 110-112. |
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