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Cost model for VLSI/MCM systems

M. Kafrounni, C. Thibeault and Yvon Savaria

Paper (1997)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/30365/
Conference Title: IEEE Symposium on Defect and Fault Tolerance in VLSI Systems
Conference Location: Paris, France
Conference Date(s): 1997-10-20 - 1997-10-22
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/dftvs.1997.628320
Official URL: https://doi.org/10.1109/dftvs.1997.628320
Date Deposited: 18 Apr 2023 15:23
Last Modified: 25 Sep 2024 16:12
Cite in APA 7: Kafrounni, M., Thibeault, C., & Savaria, Y. (1997, October). Cost model for VLSI/MCM systems [Paper]. IEEE Symposium on Defect and Fault Tolerance in VLSI Systems, Paris, France. https://doi.org/10.1109/dftvs.1997.628320

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