M. Kafrounni, C. Thibeault and Yvon Savaria
Paper (1997)
An external link is available for this itemAdditional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
PolyPublie URL: | https://publications.polymtl.ca/30365/ |
Conference Title: | IEEE Symposium on Defect and Fault Tolerance in VLSI Systems |
Conference Location: | Paris, France |
Conference Date(s): | 1997-10-20 - 1997-10-22 |
Publisher: | Institute of Electrical and Electronics Engineers |
DOI: | 10.1109/dftvs.1997.628320 |
Official URL: | https://doi.org/10.1109/dftvs.1997.628320 |
Date Deposited: | 18 Apr 2023 15:23 |
Last Modified: | 25 Sep 2024 16:12 |
Cite in APA 7: | Kafrounni, M., Thibeault, C., & Savaria, Y. (1997, October). Cost model for VLSI/MCM systems [Paper]. IEEE Symposium on Defect and Fault Tolerance in VLSI Systems, Paris, France. https://doi.org/10.1109/dftvs.1997.628320 |
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