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An accurate on-wafer de-embedding technique with application to HBT devices characterization

S. Bousnina, C. Falt, P. Mandeville, A. B. Kouki and Fadhel M. Ghannouchi

Article (2002)

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Department: Department of Electrical Engineering
PolyPublie URL: https://publications.polymtl.ca/26809/
Journal Title: IEEE Transactions on Microwave Theory and Techniques (vol. 50, no. 2)
Publisher: IEEE
DOI: 10.1109/22.982218
Official URL: https://doi.org/10.1109/22.982218
Date Deposited: 18 Apr 2023 15:20
Last Modified: 05 Apr 2024 11:14
Cite in APA 7: Bousnina, S., Falt, C., Mandeville, P., Kouki, A. B., & Ghannouchi, F. M. (2002). An accurate on-wafer de-embedding technique with application to HBT devices characterization. IEEE Transactions on Microwave Theory and Techniques, 50(2), 420-424. https://doi.org/10.1109/22.982218

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