S. Bousnina, C. Falt, P. Mandeville, A. B. Kouki and Fadhel M. Ghannouchi
Article (2002)
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| Department: | Department of Electrical Engineering |
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| PolyPublie URL: | https://publications.polymtl.ca/26809/ |
| Journal Title: | IEEE Transactions on Microwave Theory and Techniques (vol. 50, no. 2) |
| Publisher: | IEEE |
| DOI: | 10.1109/22.982218 |
| Official URL: | https://doi.org/10.1109/22.982218 |
| Date Deposited: | 18 Apr 2023 15:20 |
| Last Modified: | 08 Apr 2025 02:16 |
| Cite in APA 7: | Bousnina, S., Falt, C., Mandeville, P., Kouki, A. B., & Ghannouchi, F. M. (2002). An accurate on-wafer de-embedding technique with application to HBT devices characterization. IEEE Transactions on Microwave Theory and Techniques, 50(2), 420-424. https://doi.org/10.1109/22.982218 |
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