Documents dont l'auteur est "Falt, C."

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Bousnina, S., Falt, C., Mandeville, P., Kouki, A. B., & Ghannouchi, F. M. (2002). An accurate on-wafer de-embedding technique with application to HBT devices characterization. IEEE Transactions on Microwave Theory and Techniques, 50(2), 420-424. Lien externe