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An Integrated Test Platform for Nanostructure Electrical Characterization

O. Duval, L. P. Lafrance, Yvon Savaria and Patrick Desjardins

Paper (2004)

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Department: Department of Engineering Physics
Department of Electrical Engineering
PolyPublie URL: https://publications.polymtl.ca/25081/
Conference Title: International Conference on Mems, Nano and Smart Systems (ICMENS 2004)
Conference Location: Banff, Canada
Conference Date(s): 2004-08-25 - 2004-08-27
Publisher: IEEE Computer Society
DOI: 10.1109/icmens.2004.1508953
Official URL: https://doi.org/10.1109/icmens.2004.1508953
Date Deposited: 18 Apr 2023 15:19
Last Modified: 05 Apr 2024 11:11
Cite in APA 7: Duval, O., Lafrance, L. P., Savaria, Y., & Desjardins, P. (2004, August). An Integrated Test Platform for Nanostructure Electrical Characterization [Paper]. International Conference on Mems, Nano and Smart Systems (ICMENS 2004), Banff, Canada. https://doi.org/10.1109/icmens.2004.1508953

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