O. Duval, L. P. Lafrance, Yvon Savaria
and Patrick Desjardins
Paper (2004)
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| Department: |
Department of Engineering Physics Department of Electrical Engineering |
|---|---|
| ISBN: | 0769521894 |
| PolyPublie URL: | https://publications.polymtl.ca/25081/ |
| Conference Title: | International Conference on Mems, Nano and Smart Systems (ICMENS 2004) |
| Conference Location: | Banff, Canada |
| Conference Date(s): | 2004-08-25 - 2004-08-27 |
| Publisher: | IEEE Computer Society |
| DOI: | 10.1109/icmens.2004.1508953 |
| Official URL: | https://doi.org/10.1109/icmens.2004.1508953 |
| Date Deposited: | 18 Apr 2023 15:19 |
| Last Modified: | 08 Apr 2025 02:13 |
| Cite in APA 7: | Duval, O., Lafrance, L. P., Savaria, Y., & Desjardins, P. (2004, August). An Integrated Test Platform for Nanostructure Electrical Characterization [Paper]. International Conference on Mems, Nano and Smart Systems (ICMENS 2004), Banff, Canada. https://doi.org/10.1109/icmens.2004.1508953 |
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