Hung Tien Bui and Yvon Savaria
Paper (2005)
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| Department: | Department of Electrical Engineering |
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| ISBN: | 0769524036 |
| PolyPublie URL: | https://publications.polymtl.ca/24339/ |
| Conference Title: | 5th International Workshop on System on Chip for Real-Time Applications (IWSOC 2005) |
| Conference Location: | Banff, Alberta, Canada |
| Conference Date(s): | 2005-07-20 - 2005-07-24 |
| Publisher: | IEEE Computer Society |
| DOI: | 10.1109/iwsoc.2005.9 |
| Official URL: | https://doi.org/10.1109/iwsoc.2005.9 |
| Date Deposited: | 18 Apr 2023 15:18 |
| Last Modified: | 08 Apr 2025 02:12 |
| Cite in APA 7: | Bui, H. T., & Savaria, Y. (2005, July). A Generic Method for Embedded Measurement and Compensation of Process and Temperature Variations in Socs [Paper]. 5th International Workshop on System on Chip for Real-Time Applications (IWSOC 2005), Banff, Alberta, Canada. https://doi.org/10.1109/iwsoc.2005.9 |
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