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High contrast imaging of interphases in ternary polymer blends using focused ion beam preparation and atomic force microscopy

Nick Virgilio, M. F. Pépin, Patrick Desjardins, Gilles L'Espérance and Basil D. Favis

Paper (2005)

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Department: Department of Chemical Engineering
Department of Engineering Physics
Department of Mathematics and Industrial Engineering
PolyPublie URL: https://publications.polymtl.ca/23563/
Conference Title: PPS 2005 America's Regional Meeting of the Polymer Processing Society
Conference Location: Québec, QC, Canada.
Conference Date(s): 2005-08-14 - 2005-08-17
Date Deposited: 18 Apr 2023 15:18
Last Modified: 05 Apr 2024 11:08
Cite in APA 7: Virgilio, N., Pépin, M. F., Desjardins, P., L'Espérance, G., & Favis, B. D. (2005, August). High contrast imaging of interphases in ternary polymer blends using focused ion beam preparation and atomic force microscopy [Paper]. PPS 2005 America's Regional Meeting of the Polymer Processing Society, Québec, QC, Canada..

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