Afshin Nourivand, Asim J. Al-Khalili and Yvon Savaria
Paper (2008)
An external link is available for this itemDepartment: | Department of Electrical Engineering |
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ISBN: | 9781424421664 |
PolyPublie URL: | https://publications.polymtl.ca/20397/ |
Conference Title: | 51st IEEE International Midwest Symposium on Circuits and Systems (MWSCAS 2008) |
Conference Location: | Knoxville, TN, United states |
Conference Date(s): | 2008-08-10 - 2008-08-13 |
Publisher: | Institute of Electrical and Electronics Engineers |
DOI: | 10.1109/mwscas.2008.4616827 |
Official URL: | https://doi.org/10.1109/mwscas.2008.4616827 |
Date Deposited: | 18 Apr 2023 15:16 |
Last Modified: | 08 Apr 2025 02:07 |
Cite in APA 7: | Nourivand, A., Al-Khalili, A. J., & Savaria, Y. (2008, August). Aggressive leakage reduction of SRAMs using error checking and correcting (ECC) techniques [Paper]. 51st IEEE International Midwest Symposium on Circuits and Systems (MWSCAS 2008), Knoxville, TN, United states. https://doi.org/10.1109/mwscas.2008.4616827 |
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