Afshin Nourivand, Asim J. Al-Khalili and Yvon Savaria
Paper (2008)
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| Department: | Department of Electrical Engineering |
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| ISBN: | 9781424421664 |
| PolyPublie URL: | https://publications.polymtl.ca/20397/ |
| Conference Title: | 51st IEEE International Midwest Symposium on Circuits and Systems (MWSCAS 2008) |
| Conference Location: | Knoxville, TN, United states |
| Conference Date(s): | 2008-08-10 - 2008-08-13 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/mwscas.2008.4616827 |
| Official URL: | https://doi.org/10.1109/mwscas.2008.4616827 |
| Date Deposited: | 18 Apr 2023 15:16 |
| Last Modified: | 08 Apr 2025 02:07 |
| Cite in APA 7: | Nourivand, A., Al-Khalili, A. J., & Savaria, Y. (2008, August). Aggressive leakage reduction of SRAMs using error checking and correcting (ECC) techniques [Paper]. 51st IEEE International Midwest Symposium on Circuits and Systems (MWSCAS 2008), Knoxville, TN, United states. https://doi.org/10.1109/mwscas.2008.4616827 |
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