Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: Applications to texture and defects determination in oriented thin films and nanoprecipitates

Simon Gaudet, Koen De Keyser, Samuel Lambert-Milot, Jean Jordan-Sweet, Christophe Detavernier, Christian Lavoie et Patrick Desjardins

Article de revue (2013)

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Département:	Département de génie physique
URL de PolyPublie:	https://publications.polymtl.ca/13872/
Titre de la revue:	Journal of vacuum science and technology. A, Vacuum, surfaces, and films (vol. 31, no 2)
Maison d'édition:	American Vacuum Society
DOI:	10.1116/1.4789984
URL officielle:	https://doi.org/10.1116/1.4789984
Date du dépôt:	18 avr. 2023 15:09
Dernière modification:	05 avr. 2024 10:53

Citer en APA 7:	Gaudet, S., De Keyser, K., Lambert-Milot, S., Jordan-Sweet, J., Detavernier, C., Lavoie, C., & Desjardins, P. (2013). Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: Applications to texture and defects determination in oriented thin films and nanoprecipitates. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 31(2). https://doi.org/10.1116/1.4789984

Citer en APA 7:

Gaudet, S., De Keyser, K., Lambert-Milot, S., Jordan-Sweet, J., Detavernier, C., Lavoie, C., & Desjardins, P. (2013). Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: Applications to texture and defects determination in oriented thin films and nanoprecipitates. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 31(2). https://doi.org/10.1116/1.4789984

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