A methodology for system-level fault injection based on gate-level faulty behavior

R. Robache, Jean-François Boland, Claude Thibeault and Yvon Savaria

Paper (2013)

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Department:	Department of Electrical Engineering
Research Center:	GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL:	https://publications.polymtl.ca/13207/
Conference Title:	11th IEEE International New Circuits and Systems Conference (NEWCAS 2013)
Conference Location:	Paris, France
Conference Date(s):	2013-06-16 - 2013-06-19
Publisher:	Institute of Electrical and Electronics Engineers
DOI:	10.1109/newcas.2013.6573663
Official URL:	https://doi.org/10.1109/newcas.2013.6573663
Date Deposited:	18 Apr 2023 15:10
Last Modified:	08 Apr 2025 12:20

Cite in APA 7:	Robache, R., Boland, J.-F., Thibeault, C., & Savaria, Y. (2013, June). A methodology for system-level fault injection based on gate-level faulty behavior [Paper]. 11th IEEE International New Circuits and Systems Conference (NEWCAS 2013), Paris, France. https://doi.org/10.1109/newcas.2013.6573663
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