Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing

M. 'hammed Sahnoun, Belgacem Bettayeb, Samuel Bassetto et Michel Tollenaere

Article de revue (2014)

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Département:	Département de mathématiques et de génie industriel
URL de PolyPublie:	https://publications.polymtl.ca/11636/
Titre de la revue:	Journal of Intelligent Manufacturing (vol. 27, no 6)
Maison d'édition:	Springer
DOI:	10.1007/s10845-014-0956-x
URL officielle:	https://doi.org/10.1007/s10845-014-0956-x
Date du dépôt:	18 avr. 2023 15:08
Dernière modification:	25 sept. 2024 15:48

Citer en APA 7:	Sahnoun, M. , Bettayeb, B., Bassetto, S., & Tollenaere, M. (2014). Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing. Journal of Intelligent Manufacturing, 27(6), 1335-1349. https://doi.org/10.1007/s10845-014-0956-x
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