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Brodeur, J., Rahier, E., Chartray-Pronovost, M., Robert, É., Moutanabbir, O., & Kéna-Cohen, S. (2025). Current Crowding in a High-Efficiency Black Phosphorus Light-Emitting Diode Using a Reflective Back Contact. [Commentaire ou lettre]. PubMed, 7 pages. Lien externe
Daoust, P., Del Vecchio, P., Rotaru, N., Dubé-Valade, A., Assali, S., Attiaoui, A., Daligou, G. T. E. G., Koelling, S., Luo, L., Rahier, E., & Moutanabbir, O. (2025). Reduced Pressure Chemical Vapour Deposition Growth of Nuclear Spin-Free 70Ge/28Si70Ge Heterostructures on Industrial Si-Ge Substrates. Meeting abstracts/Meeting abstracts (Electrochemical Society. CD-ROM), MA2025-01(36), 1717 (1 page). Lien externe
Montpetit, L., Singh, S., Rahier, E., Atalla, M., & Moutanabbir, O. (novembre 2025). Annealing of Au-CdZnTe Detectors: Thermal Budget Constraints and Interfacial Stability [Communication écrite]. Nuclear Science Symposium (NSS 2025), Medical Imaging Conference (MIC 2025) and Room Temperature Semiconductor Detector Conference (RTSD 2025), Yokohama, Japan (1 page). Lien externe
Rahier, E., Koelling, S., Singh, S., Montpetit, L., & Moutanabbir, O. (novembre 2025). Tracking the Three-Dimensional Distribution of Growth Impurities in Cd₀.₉Zn₀.₁Te Single Crystal [Communication écrite]. Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), Yokohama, Japan (1 page). Lien externe
Remondina, J., Rahier, E., Anh Luong, M., Ratel-Ramond, N., Ran, S., Grosso, D., Mocuta, C., Portavoce, A., Le Friec, Y., Benoit, D., Petroni, E., Claverie, A., & Putero, M. (2025). Tuning Crystallization Pathways in Ge‐Rich GST Alloys: The Influence of Nitrogen and Hydrogen. physica status solidi (RRL) – Rapid Research Letters, 19(7), 2500035 (11 pages). Disponible
Singh, S., Montpetit, L., Rahier, E., Atalla, M., Koelling, S., & Moutanabbir, O. (novembre 2025). Interpixel Passivation of CZT Detectors via ALD-Deposited Al₂O₃ [Communication écrite]. Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), Yokohama, Japan (1 page). Lien externe
