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Bany Hamad, G., Kazma, G., Mohamed, O. A.̈., & Savaria, Y. (juillet 2017). Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT [Communication écrite]. 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece. Lien externe
Kazma, G., Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (juin 2017). Analysis of SEU propagation in sequential circuits at RTL using Satisfiability Modulo Theories [Communication écrite]. 15th IEEE International New Circuits and Systems Conference (NEWCAS 2017), Strasbourg, France. Lien externe
Kazma, G., Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (mai 2017). Analysis of SEU Propagation in Combinational Circuits at RTL Based on Satisfiability Modulo Theories [Communication écrite]. Great Lakes Symposium on VLSI (GLSVLSI 2017), Banff, Alberta. Lien externe
