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Darvishi, M., Audet, Y., Blaquière, Y., Thibeault, C., Pichette, S., & Tazi, F. Z. (2014). Circuit level modeling of extra combinational delays in SRAM-based FPGAs due to transient ionizing radiation. IEEE Transactions on Nuclear Science, 61(6), 3535-3542. Lien externe
Hobeika, C., Pichette, S., Léonard, M.-A., Thibeault, C., Boland, J.-F., & Audet, Y. (juillet 2014). Multi-abstraction level signature generation and comparison based on radiation single event upset [Communication écrite]. 20th IEEE International On-Line Testing Symposium (IOLTS 2014), Catalunya, Spain. Lien externe
Hoque, K. A., Mohamed, O. A.̈., Savaria, Y., & Thibeault, C. (octobre 2014). Probabilistic model checking based DAL analysis to optimize a combined TMR-blind-scrubbing mitigation technique for FPGA-based aerospace applications [Communication écrite]. 12th ACM/IEEE International Conference on Methods and Models for System Design (MEMOCODE 2014), Lausanne, Switzerland. Lien externe
Tazi, F. Z., Thibeault, C., Savaria, Y., Pichette, S., & Audet, Y. (2014). On extra delays affecting I/O blocks of an SRAM-based FPGA due to ionizing radiation. IEEE Transactions on Nuclear Science, 61(6), 3138-3145. Lien externe
