Documents publiés en "2012"

B

Bettayeb, B., Bassetto, S., Vialletelle, P., & Tollenaere, M. (2012). Quality and exposure control in semiconductor manufacturing. Part I: Modelling. International Journal of Production Research, 50(23), 6835-6851. Lien externe

Bettayeb, B., Bassetto, S., Vialletelle, P., & Tollenaere, M. (2012). Quality and exposure control in semiconductor manufacturing. Part II: Evaluation. International Journal of Production Research, 50(23), 6852-6869. Lien externe

S

Sahnoun, M. , Bettayeb, B., Tollenaere, M., & Bassetto, S. (mars 2012). Smart sampling for risk reduction and delay optimisation [Communication écrite]. IEEE International Systems Conference, Vancouver, BC, Canada. Lien externe