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Cova, P., Poulin, S., & Masut, R. A. (2005). X-Ray Photoelectron Spectroscopy and Structural Analysis of Amorphous Si OₓNy Films Deposited at Low Temperatures. Journal of Applied Physics, 98(9). Lien externe
Cova, P., Poulin, S., Grenier, O., & Masut, R. A. (2005). A Method for the Analysis of Multiphase Bonding Structures in Amorphous SiOₓ Ny Films. Journal of Applied Physics, 97(7). Lien externe
