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Amassian, A., Larouche, S., Sapieha, J.-E., Desjardins, P., & Martinu, L. (avril 2002). In situ ellipsometric study of the initial growth stages of a TiO₂ by PECVD [Communication écrite]. 45th Annual Technical Conference of the Society of Vacuum Coaters, Lake Buena Vista, FL, USA. Lien externe
Amassian, A., Larouche, S., Vernhes, R., Sapieha, J.-E., Desjardins, P., & Martinu, L. (mai 2002). Analysis and control of optical film growth by in situ real-time spectroscopic ellipsometry [Communication écrite]. SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging (Opto Canada 2002), Ottawa, Ont., Can.. Lien externe
Wróbel, A. M., Walkiewicz-Pietrzykowska, A., Sapieha, J.-E., Hatanaka, Y., Aoki, T., & Nakanishi, Y. (2002). Remote Hydrogen Plasma Chemical Vapor Deposition of Silicon- Carbon Thin-Film Materials From a Hexamethyldisilane Source: Characterization of the Process and the Deposits. Journal of Applied Polymer Science, 86(6), 1445-1458. Lien externe
