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Amassian, A., Larouche, S., Sapieha, J.-E., Desjardins, P., & Martinu, L. (avril 2002). In situ ellipsometric study of the initial growth stages of a TiO₂ by PECVD [Communication écrite]. 45th Annual Technical Conference of the Society of Vacuum Coaters, Lake Buena Vista, FL, USA. Lien externe
Amassian, A., Larouche, S., Vernhes, R., Sapieha, J.-E., Desjardins, P., & Martinu, L. (mai 2002). Analysis and control of optical film growth by in situ real-time spectroscopic ellipsometry [Communication écrite]. SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging (Opto Canada 2002), Ottawa, Ont., Can.. Lien externe
Dalacu, D., & Martinu, L. (2002). Ellipsometric Characterization of the Optical Constants of Metals: Thin Film versus Nanoparticle. Dans Sacher, E. (édit.), Metallization of Polymers 2 (p. 11-22). Lien externe
Hong, J., Truica-Marasescu, F., Martinu, L., & Wertheimer, M. R. (2002). An investigation of plasma-polymer interactions by mass spectrometry. Plasmas and Polymers, 7(3), 245-260. Lien externe
Poitras, D., Larouche, S., & Martinu, L. (2002). Design and Plasma Deposition of Dispersion-Corrected Multiband Rugate Filters. Applied Optics, 41(25), 5249-5255. Lien externe
