<  Back to the Polytechnique Montréal portal

Ellipsometric Characterization of the Optical Constants of Metals: Thin Film versus Nanoparticle

Dan Dalacu and Ludvik Martinu

Book Section (2002)

An external link is available for this item
Additional Information: Metallization of polymers 2. Montréal workshop on Polymer metallization held in Montréal in June 2001.
Department: Department of Engineering Physics
ISBN: 9781461505631
PolyPublie URL: https://publications.polymtl.ca/52519/
Editors: Edward Sacher
Publisher: Springer
DOI: 10.1007/978-1-4615-0563-1_2
Official URL: https://doi.org/10.1007/978-1-4615-0563-1_2
Date Deposited: 18 Apr 2023 15:20
Last Modified: 08 Apr 2025 07:21
Cite in APA 7: Dalacu, D., & Martinu, L. (2002). Ellipsometric Characterization of the Optical Constants of Metals: Thin Film versus Nanoparticle. In Sacher, E. (ed.), Metallization of Polymers 2 (pp. 11-22). https://doi.org/10.1007/978-1-4615-0563-1_2

Statistics

Dimensions

Repository Staff Only

View Item View Item