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Decorse, P., Quenneville, E., Poulin, S., Meunier, M., Yelon, A., & Morin, F. (2001). Chemical and structural characterization of La₀.₅Sr₀.₅MnO₃ thin films prepared by pulsed-laser deposition. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 19(3), 910-915. Lien externe
Quenneville, E., Meunier, M., Yelon, A., & Morin, F. (2001). Electronic Transport by Small Polarons in La₀.₅ Sr₀.₅ MnO₃. Journal of Applied Physics, 90(4), 1891-1897. Lien externe
Sheng, S., Sacher, E., & Yelon, A. (2001). Structural Changes in Amorphous Silicon Studied by X-Ray Photoemission Spectroscopy: a Phenomenon Independent of the Staebler-Wronski Effect? Journal of Non-Crystalline Solids, 282(2-3), 165-172. Lien externe
Sheng, S., Sacher, E., & Yelon, A. (avril 2000). X-ray photoemission spectroscopic study of light-induced structural changes in amorphous silicon [Communication écrite]. Amorphous and Heterogeneous Silicon Thin Films - 2000. Symposium, San Francisco, CA, USA. Lien externe