 | Monter d'un niveau |
Arabi, K., & Kaminska, B. (octobre 1996). A new technique to monitor the electrode and lead failures in implantable microstimulators and sensors [Communication écrite]. 1996 18th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Amsterdam, Netherlands. Lien externe
Arabi, K., & Kaminska, B. (avril 1996). Oscillation-test strategy for analog and mixed-signal integrated circuits [Communication écrite]. 1996 14th IEEE VLSI Test Symposium, Princeton, NJ, USA. Lien externe
Arabi, K., & Kaminska, B. (octobre 1996). A practical and low-cost test method to design reliable implantable systems [Communication écrite]. 1996 18th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Amsterdam, Netherlands. Lien externe
Arabi, K., Kaminska, B., & Rzeszut, J. (1996). BIST for D/A and A/D converters. IEEE Design & Test of Computers, 13(4), 40-49. Lien externe
Arabi, K., Kaminska, B., & Sunter, S. (octobre 1996). Design for testability of integrated operational amplifiers using oscillation-test strategy [Communication écrite]. 1996 International Conference on Computer Design, ICCD'96, Austin, TX, USA. Lien externe
Ehsanian, M., Kaminska, B., & Arabi, K. (avril 1996). New digital test approach for analog-to-digital converter testing [Communication écrite]. 1996 14th IEEE VLSI Test Symposium, Princeton, NJ, USA. Lien externe
Arabi, K., & Kaminska, B. (octobre 1996). A new technique to monitor the electrode and lead failures in implantable microstimulators and sensors [Communication écrite]. 1996 18th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Amsterdam, Netherlands. Lien externe
Arabi, K., & Kaminska, B. (avril 1996). Oscillation-test strategy for analog and mixed-signal integrated circuits [Communication écrite]. 1996 14th IEEE VLSI Test Symposium, Princeton, NJ, USA. Lien externe
Arabi, K., & Kaminska, B. (octobre 1996). A practical and low-cost test method to design reliable implantable systems [Communication écrite]. 1996 18th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Amsterdam, Netherlands. Lien externe
Arabi, K., Kaminska, B., & Rzeszut, J. (1996). BIST for D/A and A/D converters. IEEE Design & Test of Computers, 13(4), 40-49. Lien externe
Arabi, K., Kaminska, B., & Sunter, S. (octobre 1996). Design for testability of integrated operational amplifiers using oscillation-test strategy [Communication écrite]. 1996 International Conference on Computer Design, ICCD'96, Austin, TX, USA. Lien externe
Ehsanian, M., Kaminska, B., & Arabi, K. (avril 1996). New digital test approach for analog-to-digital converter testing [Communication écrite]. 1996 14th IEEE VLSI Test Symposium, Princeton, NJ, USA. Lien externe
