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Number of items: 6.

Article

Akyel, C., & Bosisio, R. (1979). Wide-Range Dynamic Complex Dielectric Constant Measurements Using Microprocessor Control Techniques. IEEE Transactions on Instrumentation and Measurement, 28(4), 272-278. External link

Bures, J., Meyer, P., & Fernandez, G. (1979). Reconstitution d'un profil d'eclairement echantillonne par une ligne de micro-photodiodes. Optics Communications, 28(1), 39-44. External link

Gauvin, J. (1979). The Generalized Gradient of a Marginal Function in Mathematical Programming. Mathematics of Operations Research, 4(4), 458-463. External link

Hamel, F., Bailon, J.-P., & Bassim, M. N. (1979). Constructive and destructive interference in acoustic emission during fatigue crack propagation. Ultrasonics, 17(3), 125-127. External link

Sapieha, S., Wertheimer, M. R., & Yelon, A. (1979). A Simple Method for Breakdown Voltage Measurements in Thin Films. IEEE Transactions on Electrical Insulation, EI-14(4), 229-230. External link

Villeneuve, L., & Riopel, D. (1979). Modèle de mesure de la technologie : un nouvel outil de gestion. Revue internationale de gestion, 75-81. Unavailable

List generated on: Thu May 23 21:04:53 2024 EDT