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Wide-Range Dynamic Complex Dielectric Constant Measurements Using Microprocessor Control Techniques

Cevdet Akyel and Rénato Bosisio

Article (1979)

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Department: Department of Electrical Engineering
PolyPublie URL: https://publications.polymtl.ca/55520/
Journal Title: IEEE Transactions on Instrumentation and Measurement (vol. 28, no. 4)
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tim.1979.4314831
Official URL: https://doi.org/10.1109/tim.1979.4314831
Date Deposited: 20 Sep 2023 13:22
Last Modified: 05 Apr 2024 12:02
Cite in APA 7: Akyel, C., & Bosisio, R. (1979). Wide-Range Dynamic Complex Dielectric Constant Measurements Using Microprocessor Control Techniques. IEEE Transactions on Instrumentation and Measurement, 28(4), 272-278. https://doi.org/10.1109/tim.1979.4314831

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