S. Sapieha, Michael R. Wertheimer
and Arthur Yelon
Article (1979)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/38224/ |
| Journal Title: | IEEE Transactions on Electrical Insulation (vol. EI-14, no. 4) |
| Publisher: | IEEE |
| DOI: | 10.1109/tei.1979.298177 |
| Official URL: | https://doi.org/10.1109/tei.1979.298177 |
| Date Deposited: | 18 Apr 2023 15:26 |
| Last Modified: | 25 Sep 2024 16:22 |
| Cite in APA 7: | Sapieha, S., Wertheimer, M. R., & Yelon, A. (1979). A Simple Method for Breakdown Voltage Measurements in Thin Films. IEEE Transactions on Electrical Insulation, EI-14(4), 229-230. https://doi.org/10.1109/tei.1979.298177 |
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