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A Simple Method for Breakdown Voltage Measurements in Thin Films

S. Sapieha, Michael R. Wertheimer and Arthur Yelon

Article (1979)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/38224/
Journal Title: IEEE Transactions on Electrical Insulation (vol. EI-14, no. 4)
Publisher: IEEE
DOI: 10.1109/tei.1979.298177
Official URL: https://doi.org/10.1109/tei.1979.298177
Date Deposited: 18 Apr 2023 15:26
Last Modified: 05 Apr 2024 11:32
Cite in APA 7: Sapieha, S., Wertheimer, M. R., & Yelon, A. (1979). A Simple Method for Breakdown Voltage Measurements in Thin Films. IEEE Transactions on Electrical Insulation, EI-14(4), 229-230. https://doi.org/10.1109/tei.1979.298177

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