Items where Research Center is "(CM)² - Centre for Characterization and Microscopy of Materials"

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Barreto, M. P., Veillette, R., & L'Espérance, G. (1995). Development and application of a dry ultramicrotomy technique for the preparation of galvanneal sheet coatings. Microscopy Research and Technique, 31(4), 293-299. External link

Beaudoin, M., Masut, R. A., Isnard, L., Desjardins, P., Bensaada, A., L'Espérance, G., & Leonelli, R. (1994, November). Band offsets of InAsxP₁₋x/InP strained layer quantum wells grown by LP-MOVPE using TBAs [Paper]. Microcrystalline and nanocrystalline semiconductors : Symposium F of the 1994 Fall Meeting of the Materials Research Society, Boston, USA. External link