Documents dont le centre de recherche est "(CM)² - Centre de caractérisation microscopique des matériaux"

Barreto, M. P., Veillette, R., & L'Espérance, G. (1995). Development and application of a dry ultramicrotomy technique for the preparation of galvanneal sheet coatings. Microscopy Research and Technique, 31(4), 293-299. Lien externe

Beaudoin, M., Masut, R. A., Isnard, L., Desjardins, P., Bensaada, A., L'Espérance, G., & Leonelli, R. (novembre 1994). Band offsets of InAsxP₁₋x/InP strained layer quantum wells grown by LP-MOVPE using TBAs [Communication écrite]. Microcrystalline and nanocrystalline semiconductors : Symposium F of the 1994 Fall Meeting of the Materials Research Society, Boston, USA. Lien externe