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Items where Author is "Shi, M. K."

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Number of items: 11.

Article

Léonard, D., Bertrand, P., Shi, M. K., Sacher, E., & Martinu, L. (1999). Plasma surface modification of fluoropolymers studied by ToF-SIMS. Plasmas and Polymers, 4(2-3), 97-111. External link

Léonard, D., Bertrand, P., Shi, M. K., Sacher, E., Martinu, L., & Meunier, M. (1997). Plasma surface modification of fluoropolymer studied in TOF-SIMS. Electrochem. abstracts, 97, 311-311. Unavailable

Shi, M. K., Martinu, L., Sacher, E., Selmani, A., Wertheimer, M. R., & Yelon, A. (1995). Angle-resolved XPS study of plasma-treated teflon PFA surfaces. Surface and Interface Analysis, 23(2), 99-104. External link

Shi, M. K., Legros, A., Mouton, A., Selmani, A., & Currie, J. F. (1995). Crystallization of vacuum-evaporated Se studied by near infrared microscope. Journal of Materials Science Letters, 14(18), 1278-1280. External link

Shi, M. K., Selmani, A., Martinu, L., Sacher, E., Wertheimer, M. R., & Yelon, A. (1994). Fluoropolymer surface modification for enhanced evaporated metal adhesion. Journal of Adhesion Science and Technology, 8(10), 1129-1141. External link

Shi, M. K., Lamontagne, B., Selmani, A., Martinu, L., Sacher, E., Wertheimer, M. R., & Yelon, A. (1994). Metallization of Teflon PFA. I. Interactions of evaporated Cr and Al measured by X-ray photoelectron spectroscopy. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 12(1), 29-34. External link

Shi, M. K., Lamontagne, B., Selmani, A., Martinu, L., Sacher, E., Wertheimer, M. R., & Yelon, A. (1994). Metallization of Teflon PFA. II. Interactions of Ti, Ag, and Au measured by X-ray photoelectron spectroscopy. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 12(3), 807-812. External link

Shi, M. K., Lamontagne, B., Martinu, L., & Selmani, A. (1993). X-Ray-Induced Modification Of Metal Fluoropolymer Interfaces. Journal of Applied Physics, 74(3), 1744-1746. External link

Paper

Shi, M. K., Sacher, E., & Meunier, M. (1997, January). Excimer laser removal of organic contaminants from silicon wafer surfaces [Paper]. Annual Meeting of the Adhesion Society. Unavailable

Shi, M. K., Sacher, E., & Meunier, M. (1997, February). Excimer-laser removal of organic contaminants from silicone wafer surfaces [Paper]. 20th Annual Anniversary Meeting of the Adhesion Society, Hilton Head Island, S.C. Unavailable

Sapieha, J.-E., Shi, M. K., Martinu, L., & Wertheimer, M. R. (1995, May). Surface enhancement of polymers by low pressure plasma treatments [Paper]. 53rd Annual Technical Conference, Boston, MA, USA. Unavailable

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