Metallization of Teflon PFA. I. Interactions of evaporated Cr and Al measured by X-ray photoelectron spectroscopy

M. K. Shi, B. Lamontagne, Amine Selmani, Ludvik Martinu, Edward Sacher, Michael R. Wertheimer and Arthur Yelon

Article (1994)

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Department:	Department of Engineering Physics Department of Chemical Engineering
PolyPublie URL:	https://publications.polymtl.ca/32863/
Journal Title:	Journal of vacuum science and technology. A, Vacuum, surfaces, and films (vol. 12, no. 1)
Publisher:	American Vacuum Society
DOI:	10.1116/1.578900
Official URL:	https://doi.org/10.1116/1.578900
Date Deposited:	18 Apr 2023 15:25
Last Modified:	08 Apr 2025 06:53

Cite in APA 7:	Shi, M. K., Lamontagne, B., Selmani, A., Martinu, L., Sacher, E., Wertheimer, M. R., & Yelon, A. (1994). Metallization of Teflon PFA. I. Interactions of evaporated Cr and Al measured by X-ray photoelectron spectroscopy. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 12(1), 29-34. https://doi.org/10.1116/1.578900
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