M. K. Shi, Ludvik Martinu
, Edward Sacher, Amine Selmani, Michael R. Wertheimer and Arthur Yelon
Article (1995)
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| Department: |
Department of Engineering Physics Department of Chemical Engineering |
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| PolyPublie URL: | https://publications.polymtl.ca/31730/ |
| Journal Title: | Surface and Interface Analysis (vol. 23, no. 2) |
| Publisher: | Wiley |
| DOI: | 10.1002/sia.740230209 |
| Official URL: | https://doi.org/10.1002/sia.740230209 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 08 Apr 2025 06:52 |
| Cite in APA 7: | Shi, M. K., Martinu, L., Sacher, E., Selmani, A., Wertheimer, M. R., & Yelon, A. (1995). Angle-resolved XPS study of plasma-treated teflon PFA surfaces. Surface and Interface Analysis, 23(2), 99-104. https://doi.org/10.1002/sia.740230209 |
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