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Angle-resolved XPS study of plasma-treated teflon PFA surfaces

M. K. Shi, Ludvik Martinu, Edward Sacher, Amine Selmani, Michael R. Wertheimer and Arthur Yelon

Article (1995)

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Department: Department of Engineering Physics
Department of Chemical Engineering
PolyPublie URL: https://publications.polymtl.ca/31730/
Journal Title: Surface and Interface Analysis (vol. 23, no. 2)
Publisher: Wiley
DOI: 10.1002/sia.740230209
Official URL: https://doi.org/10.1002/sia.740230209
Date Deposited: 18 Apr 2023 15:25
Last Modified: 08 Jun 2023 11:39
Cite in APA 7: Shi, M. K., Martinu, L., Sacher, E., Selmani, A., Wertheimer, M. R., & Yelon, A. (1995). Angle-resolved XPS study of plasma-treated teflon PFA surfaces. Surface and Interface Analysis, 23(2), 99-104. https://doi.org/10.1002/sia.740230209



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