<  Back to the Polytechnique Montréal portal

Items where Author is "Qiu, Bing"

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Jump to: L
Number of items: 1.

L

Lu, M., Savaria, Y., Qiu, B., & Taillefer, J. (2003, November). IEEE 1149.1 based defect and fault tolerant scan chain for wafer scale integration [Paper]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Boston, MA, United states. External link

List generated on: Tue Dec 10 09:58:47 2024 EST