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Collaboration networkThis graph maps the connections between all the collaborators of {}'s publications listed on this page.
Each link represents a collaboration on the same publication. The thickness of the link represents the number of collaborations.
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Lu, M., Savaria, Y., Qiu, B., & Taillefer, J. (2003, November). IEEE 1149.1 based defect and fault tolerant scan chain for wafer scale integration [Paper]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Boston, MA, United states. External link
