<  Retour au portail Polytechnique Montréal

Documents dont l'auteur est "Larouche, S."

Monter d'un niveau
Pour citer ou exporter [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Grouper par: Auteurs ou autrices | Date de publication | Sous-type de document | Aucun groupement
Aller à : A | L | P | R | T
Nombre de documents: 7

A

Amassian, A., Larouche, S., Vernhes, R., Sapieha, J.-E., Desjardins, P., & Martinu, L. (mai 2002). Analysis and control of optical film growth by in situ real-time spectroscopic ellipsometry [Communication écrite]. SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging (Opto Canada 2002), Ottawa, Ont., Can.. Lien externe

L

Larouche, S., & Martinu, L. (2008). Optical Filters With Prescribed Optical Thickness and Refined Refractive Indices. Applied Optics, 47(22), 4140-4146. Lien externe

Larouche, S., & Martinu, L. (2007). Dispersion Implementation in Optical Filter Design by the Fourier Transform Method Using Correction Factors. Applied Optics, 46(30), 7436-7441. Lien externe

P

Poitras, D., Larouche, S., & Martinu, L. (2002). Design and Plasma Deposition of Dispersion-Corrected Multiband Rugate Filters. Applied Optics, 41(25), 5249-5255. Lien externe

R

Raymond, M.-A., Larouche, S., Zabeida, O., Martinu, L., & Sapieha, J.-E. (janvier 2001). Tribological properties of PECVD optical coatings [Communication écrite]. 44th Annual Technical Conference, Philadelphia, PA, United States. Non disponible

T

Turcotte, S., Larouche, S., Beaudry, J.-N., Martinu, L., Masut, R. A., Desjardins, P., & Leonelli, R. (2009). Evidence of valence band perturbations in GaAsN/GaAs(001): Combined variable-angle spectroscopic ellipsometry and modulated photoreflectance investigation. Physical Review B, 80(8). Lien externe

Timoshevskii, V., Côté, M., Gilbert, G., Leonelli, R., Turcotte, S., Beaudry, J. N., Desjardins, P., Larouche, S., Martinu, L., & Masut, R. A. (2006). Experimental and Theoretical Studies of the E+ Optical Transition in GaAsN Alloys. Physical Review B, 74(16), 6 pages. Lien externe

Liste produite: Fri Dec 5 04:12:53 2025 EST.