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Documents dont l'auteur est "Coia, C."

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Aller à : 2010 | 2009 | 2007 | 2005 | 2001
Nombre de documents: 6

2010

Gaudet, S., Coia, C., Desjardins, P., & Lavoie, C. (2010). Metastable phase formation during the reaction of Ni films with Si(001): The role of texture inheritance. Journal of Applied Physics, 107(9), 093515-093515. Lien externe

2009

Guihard, M., Turcotte-Tremblay, P., Gaudet, S., Coia, C., Roorda, S., Desjardins, P., Lavoie, C., & Schiettekatte, F. (2009). Controlling nickel silicide phase formation by Si implantation damage. Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms, 267(8-9), 1285-1289. Lien externe

2007

Kittl, J. A., Pawlak, M. A., Torregiani, C., Lauwers, A., Demeurisse, C., Vrancken, C., Absil, P. P., Biesemans, S., Coia, C., Detavernier, C., Jordan-Sweet, J., & Lavoie, C. (2007). Transient and End Silicide Phase Formation in Thin Film Ni/Polycrystalline-Si Reactions for Fully Silicided Gate Applications. Applied Physics Letters, 91(17). Lien externe

2005

Lavoie, C., Coia, C., D'heurle, F. M., Detavernier, C., Cabral, C., Desjardins, P., & Kellock, A. J. (juillet 2004). Reactive Diffusion in the Ni-Si System: Phase Sequence and Formation of Metal-Rich Phases [Communication écrite]. Diffusion in Materials: Dimat 2004 : 6th International Conference on Diffusion in Materials, Cracow, Poland. Lien externe

2001

Lachance, J., Coia, C., Fozza, A. C., Czeremuszkin, G., Houdayer, A., & Wertheimer, M. R. (2001). Radiation-Induced Degradation of Polymeric Spacecraft Materials Under Protective Oxide Coatings. Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms, 185(1-4), 328-335. Lien externe

Coia, C., Fozza, A. C., Wertheimer, M. R., Czeremuszkin, G., & Houdayer, A. (2001). Radiation-Induced Effects in SiO₂ Protective Coatings on Polymeric Spacecraft Materials. Dans Protection of Space Materials from the Space Environment: Proceedings of ICPMSE-4, Fourth International Space Conference, held in Toronto, Canada, April 23-24, 1998 (Vol. 4, p. 281-290). Lien externe

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