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Boubezari, S. (1998). Analyse de testabilité au niveau transfert de registres [Thèse de doctorat, École Polytechnique de Montréal]. Disponible
Boubezari, S., & Kaminska, B. (1996). New reconfigurable test vector generator for built-in self-test applications. Journal of Electronic Testing: Theory and Applications (JETTA), 8(2), 153-164. Lien externe
Boubezari, S., & Kaminska, B. (1995). Deterministic built-in self-test generator based on cellular automata structures. IEEE Transactions on Computers, 44(6), 805-816. Lien externe
Boubezari, S., & Kaminska, B. (avril 1995). Mixed deterministic and pseudorandom test vector generator based on cellular automata structures [Communication écrite]. 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95, Seattle, WA, USA. Lien externe