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Bégin, M., Ghannouchi, F. M., Beauregard, F., Selmi, L., & Ricco, B. (1996). Characterization of the transient behavior of a GaAs MESFET using dynamic I-V and S-parameter measurements. IEEE Transactions on Instrumentation and Measurement, 45(1), 231-237. Lien externe
Borelli, V., Bégin, M., & Ghannouchi, F. M. (1994). Characterization of the transient behavior of a MESFET. (Rapport technique n° EPM-RT-94-05). Disponible
