A calibration and measurement method of a tri-six-port network analyzer suitable for on-wafer characterization of three-port devices

Fadhel Ghannouchi

Article (1993)

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Additional Information:	Microwave Research Laboratory
Department:	Department of Electrical Engineering
Research Center:	Other
PolyPublie URL:	https://publications.polymtl.ca/75168/
Journal Title:	IEEE Transactions on Instrumentation and Measurement (vol. 42, no. 4)
Publisher:	Institute of Electrical and Electronics Engineers
DOI:	10.1109/19.234499
Official URL:	https://doi.org/10.1109/19.234499
Date Deposited:	17 Apr 2026 14:00
Last Modified:	17 Apr 2026 14:00

Cite in APA 7:	Ghannouchi, F. (1993). A calibration and measurement method of a tri-six-port network analyzer suitable for on-wafer characterization of three-port devices. IEEE Transactions on Instrumentation and Measurement, 42(4), 864-866. https://doi.org/10.1109/19.234499
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