Shihe Li, Cevdet Akyel and Rénato Bosisio
Article (1981)
An external link is available for this item| Department: | Department of Electrical Engineering |
|---|---|
| PolyPublie URL: | https://publications.polymtl.ca/69792/ |
| Journal Title: | IEEE Transactions on Microwave Theory and Techniques (vol. 29, no. 10) |
| Publisher: | IEEE Microwave Theory and Techniques Society |
| DOI: | 10.1109/tmtt.1981.1130496 |
| Official URL: | https://doi.org/10.1109/tmtt.1981.1130496 |
| Date Deposited: | 24 Nov 2025 10:59 |
| Last Modified: | 24 Nov 2025 10:59 |
| Cite in APA 7: | Li, S., Akyel, C., & Bosisio, R. (1981). Precise Calculations and Measurements on the Complex Dielectric Constant of Lossy Materials Using TM₀₁₀ Cavity Perturbation Techniques. IEEE Transactions on Microwave Theory and Techniques, 29(10), 1041-1048. https://doi.org/10.1109/tmtt.1981.1130496 |
|---|---|
Statistics
Dimensions
