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Three-dimensional atomic-scale tomography of buried semiconductor heterointerfaces

Sebastian Koelling, Lucas E. A. Stehouwer, Brian Paquelet Wuetz, Giordano Scappucci and Oussama Moutanabbir

Article (2023)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/54093/
Journal Title: Advanced Materials: Interfaces (vol. 10, no. 3)
Publisher: Wiley
DOI: 10.1002/admi.202201189
Official URL: https://doi.org/10.1002/admi.202201189
Date Deposited: 10 Jul 2023 16:30
Last Modified: 05 Apr 2024 12:00
Cite in APA 7: Koelling, S., Stehouwer, L. E. A., Paquelet Wuetz, B., Scappucci, G., & Moutanabbir, O. (2023). Three-dimensional atomic-scale tomography of buried semiconductor heterointerfaces. Advanced Materials: Interfaces, 10(3), 2201189. https://doi.org/10.1002/admi.202201189

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