Sebastian Koelling, Lucas E. A. Stehouwer, Brian Paquelet Wuetz, Giordano Scappucci and Oussama Moutanabbir
Article (2023)
An external link is available for this item
| Department: | Department of Engineering Physics |
|---|---|
| PolyPublie URL: | https://publications.polymtl.ca/54093/ |
| Journal Title: | Advanced Materials: Interfaces (vol. 10, no. 3) |
| Publisher: | Wiley |
| DOI: | 10.1002/admi.202201189 |
| Official URL: | https://doi.org/10.1002/admi.202201189 |
| Date Deposited: | 10 Jul 2023 16:30 |
| Last Modified: | 08 Apr 2025 07:23 |
| Cite in APA 7: | Koelling, S., Stehouwer, L. E. A., Paquelet Wuetz, B., Scappucci, G., & Moutanabbir, O. (2023). Three-dimensional atomic-scale tomography of buried semiconductor heterointerfaces. Advanced Materials: Interfaces, 10(3), 2201189. https://doi.org/10.1002/admi.202201189 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
