Boris Ferdman, Lucien Weiss
, Onit Alalouf, Yonathan Haimovich and Yoav Shechtman
Article (2018)
Document published while its authors were not affiliated with Polytechnique Montréal
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| PolyPublie URL: | https://publications.polymtl.ca/49591/ |
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| Journal Title: | ACS Nano (vol. 12, no. 12) |
| Publisher: | American Chemical Society (ACS) |
| DOI: | 10.1021/acsnano.8b05849 |
| Official URL: | https://doi.org/10.1021/acsnano.8b05849 |
| Date Deposited: | 18 Apr 2023 15:03 |
| Last Modified: | 25 Sep 2024 16:39 |
| Cite in APA 7: | Ferdman, B., Weiss, L., Alalouf, O., Haimovich, Y., & Shechtman, Y. (2018). Ultrasensitive Refractometry via Supercritical Angle Fluorescence. ACS Nano, 12(12), 11892-11898. https://doi.org/10.1021/acsnano.8b05849 |
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