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Atomic-Scale Insights into Semiconductor Heterostructures: From Experimental Three-Dimensional Analysis of the Interface to a Generalized Theory of Interfacial Roughness Scattering

T. Grange, S. Mukherjee, G. Capellini, M. Montanari, L. Persichetti, L. Di Gaspare, S. Birner, A. Attiaoui, Oussama Moutanabbir, M. Virgilio and M. De Seta

Article (2020)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/45177/
Journal Title: Physical Review Applied (vol. 13, no. 4)
Publisher: American Physical Society (APS)
DOI: 10.1103/physrevapplied.13.044062
Official URL: https://doi.org/10.1103/physrevapplied.13.044062
Date Deposited: 18 Apr 2023 15:00
Last Modified: 05 Apr 2024 11:44
Cite in APA 7: Grange, T., Mukherjee, S., Capellini, G., Montanari, M., Persichetti, L., Di Gaspare, L., Birner, S., Attiaoui, A., Moutanabbir, O., Virgilio, M., & De Seta, M. (2020). Atomic-Scale Insights into Semiconductor Heterostructures: From Experimental Three-Dimensional Analysis of the Interface to a Generalized Theory of Interfacial Roughness Scattering. Physical Review Applied, 13(4), 14 pages. https://doi.org/10.1103/physrevapplied.13.044062

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