T. Grange, S. Mukherjee, G. Capellini, M. Montanari, L. Persichetti, L. Di Gaspare, S. Birner, A. Attiaoui, Oussama Moutanabbir
, M. Virgilio and M. De Seta
Article (2020)
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| Department: | Department of Engineering Physics |
|---|---|
| PolyPublie URL: | https://publications.polymtl.ca/45177/ |
| Journal Title: | Physical Review Applied (vol. 13, no. 4) |
| Publisher: | American Physical Society (APS) |
| DOI: | 10.1103/physrevapplied.13.044062 |
| Official URL: | https://doi.org/10.1103/physrevapplied.13.044062 |
| Date Deposited: | 18 Apr 2023 15:00 |
| Last Modified: | 05 May 2023 15:49 |
| Cite in APA 7: | Grange, T., Mukherjee, S., Capellini, G., Montanari, M., Persichetti, L., Di Gaspare, L., Birner, S., Attiaoui, A., Moutanabbir, O., Virgilio, M., & De Seta, M. (2020). Atomic-Scale Insights into Semiconductor Heterostructures: From Experimental Three-Dimensional Analysis of the Interface to a Generalized Theory of Interfacial Roughness Scattering. Physical Review Applied, 13(4), 14 pages. https://doi.org/10.1103/physrevapplied.13.044062 |
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