<  Back to the Polytechnique Montréal portal

A New variable testability measure: A concept for data-flow testability evaluation

M. Jamoussi, Bozena Kaminska and Dinkar Mukhedkar

Paper (1992)

An external link is available for this item
Department: Department of Electrical Engineering
PolyPublie URL: https://publications.polymtl.ca/43696/
Conference Title: 5th International Conference on VLSI Design (ICVD 1992)
Conference Location: Banglore, India
Conference Date(s): 1992-01-04 - 1992-01-07
Publisher: IEEE
DOI: 10.1109/icvd.1992.658054
Official URL: https://doi.org/10.1109/icvd.1992.658054
Date Deposited: 18 Apr 2023 15:26
Last Modified: 05 Apr 2024 11:42
Cite in APA 7: Jamoussi, M., Kaminska, B., & Mukhedkar, D. (1992, January). A New variable testability measure: A concept for data-flow testability evaluation [Paper]. 5th International Conference on VLSI Design (ICVD 1992), Banglore, India. https://doi.org/10.1109/icvd.1992.658054

Statistics

Dimensions

Repository Staff Only

View Item View Item