M. Jamoussi, Bozena Kaminska and Dinkar Mukhedkar
Paper (1992)
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| Department: | Department of Electrical Engineering |
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| ISBN: | 0818624655 |
| PolyPublie URL: | https://publications.polymtl.ca/43696/ |
| Conference Title: | 5th International Conference on VLSI Design (ICVD 1992) |
| Conference Location: | Bangalore, India |
| Conference Date(s): | 1992-01-04 - 1992-01-07 |
| Publisher: | IEEE |
| DOI: | 10.1109/icvd.1992.658054 |
| Official URL: | https://doi.org/10.1109/icvd.1992.658054 |
| Date Deposited: | 18 Apr 2023 15:26 |
| Last Modified: | 08 Oct 2024 16:27 |
| Cite in APA 7: | Jamoussi, M., Kaminska, B., & Mukhedkar, D. (1992, January). A New variable testability measure: A concept for data-flow testability evaluation [Paper]. 5th International Conference on VLSI Design (ICVD 1992), Bangalore, India. https://doi.org/10.1109/icvd.1992.658054 |
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