An Automated Non-Linear Transistor Characterization System with a High-Level Language User-Interface for Easy Control, Visualization and Data Management

Fadhel M. Ghannouchi, Ammar B. Kouki and F. Beauregard

Paper (1993)

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Additional Information:	Groupe de recherche: Laboratoire de Recherches Micro-Ondes
Department:	Department of Electrical Engineering
Research Center:	Other
ISBN:	0780356861
PolyPublie URL:	https://publications.polymtl.ca/43637/
Conference Title:	41st ARFTG Conference Digest - Spring 1993
Conference Location:	Atlanta, GA, United states
Conference Date(s):	1993-06-18
Publisher:	IEEE
DOI:	10.1109/arftg.1993.327014
Official URL:	https://doi.org/10.1109/arftg.1993.327014
Date Deposited:	18 Apr 2023 15:26
Last Modified:	08 Apr 2025 07:08

Cite in APA 7:	Ghannouchi, F. M., Kouki, A. B., & Beauregard, F. (1993, June). An Automated Non-Linear Transistor Characterization System with a High-Level Language User-Interface for Easy Control, Visualization and Data Management [Paper]. 41st ARFTG Conference Digest - Spring 1993, Atlanta, GA, United states. https://doi.org/10.1109/arftg.1993.327014
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