Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin²ψ and cosα methods

Dorian Delbergue, Damien Texier, Martin Lévesque et Philippe Bocher

Article de revue (2019)

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Département:	Département de génie mécanique
URL de PolyPublie:	https://publications.polymtl.ca/43596/
Titre de la revue:	Journal of Applied Crystallography (vol. 52, no 4)
DOI:	10.1107/s1600576719008744
URL officielle:	https://doi.org/10.1107/s1600576719008744
Date du dépôt:	18 avr. 2023 15:01
Dernière modification:	05 avr. 2024 11:41

Citer en APA 7:	Delbergue, D., Texier, D., Lévesque, M., & Bocher, P. (2019). Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin²ψ and cosα methods. Journal of Applied Crystallography, 52(4), 828-843. https://doi.org/10.1107/s1600576719008744
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