Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin²ψ and cosα methods

Dorian Delbergue, Damien Texier, Martin Lévesque and Philippe Bocher

Article (2019)

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Department:	Department of Mechanical Engineering
PolyPublie URL:	https://publications.polymtl.ca/43596/
Journal Title:	Journal of Applied Crystallography (vol. 52, no. 4)
DOI:	10.1107/s1600576719008744
Official URL:	https://doi.org/10.1107/s1600576719008744
Date Deposited:	18 Apr 2023 15:01
Last Modified:	08 Apr 2025 06:34

Cite in APA 7:	Delbergue, D., Texier, D., Lévesque, M., & Bocher, P. (2019). Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin²ψ and cosα methods. Journal of Applied Crystallography, 52(4), 828-843. https://doi.org/10.1107/s1600576719008744
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