Static probabilistic timing analysis with a permanent fault detection mechanism

Chen Chao, Jacopo Panerati, Imane Hafnaoui and Giovanni Beltrame

Paper (2017)

An external link is available for this item

Department:	Department of Computer Engineering and Software Engineering
ISBN:	9781538631669
PolyPublie URL:	https://publications.polymtl.ca/38479/
Conference Title:	12th IEEE International Symposium on Industrial Embedded Systems (SIES 2017)
Conference Location:	Toulouse, France
Conference Date(s):	2017-06-14 - 2017-06-16
Publisher:	IEEE
DOI:	10.1109/sies.2017.7993373
Official URL:	https://doi.org/10.1109/sies.2017.7993373
Date Deposited:	18 Apr 2023 15:04
Last Modified:	25 Sep 2024 16:22

Cite in APA 7:	Chao, C., Panerati, J., Hafnaoui, I., & Beltrame, G. (2017, June). Static probabilistic timing analysis with a permanent fault detection mechanism [Paper]. 12th IEEE International Symposium on Industrial Embedded Systems (SIES 2017), Toulouse, France (10 pages). https://doi.org/10.1109/sies.2017.7993373
APA 7 (HTML)ASCII CitationAtomBibTeXDOIsDublin CoreEndNote (.ENW)MARC (ISO 2709/UTF-8) (.MRC)MARC (UTF-8) (.MRK8)MARC XMLMPEG-21 DIDLMultiline CSVOAI-ORE Resource Map (Atom Format)OPENAIREOpenURL ContextObjectOpenURL ContextObject in SpanRDF+N-TriplesRDF+N3RDF+XMLReferReference Manager (.RIS)Simple Metadata

Statistics

Repository Staff Only