Revisiting and improvement of thru-reflect-line calibration for accurate measurement of substrate integrated waveguide components

Haidong Chen, Wenquan Che, Yue Chao, Wenjie Feng and Ke Wu

Article (2017)

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Department:	Department of Electrical Engineering
Research Center:	POLY-GRAMES - Advanced Research Centre in Microwaves and Space Electronics
PolyPublie URL:	https://publications.polymtl.ca/36680/
Journal Title:	IET Microwaves, Antennas & Propagation (vol. 11, no. 1)
Publisher:	Institution of Engineering and Technology
DOI:	10.1049/iet-map.2016.0150
Official URL:	https://doi.org/10.1049/iet-map.2016.0150
Date Deposited:	18 Apr 2023 15:04
Last Modified:	08 Apr 2025 06:58

Cite in APA 7:	Chen, H., Che, W., Chao, Y., Feng, W., & Wu, K. (2017). Revisiting and improvement of thru-reflect-line calibration for accurate measurement of substrate integrated waveguide components. IET Microwaves, Antennas & Propagation, 11(1), 29-35. https://doi.org/10.1049/iet-map.2016.0150
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