Haidong Chen, Wenquan Che, Yue Chao, Wenjie Feng and Ke Wu
Article (2017)
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| Department: | Department of Electrical Engineering |
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| Research Center: | POLY-GRAMES - Advanced Research Centre in Microwaves and Space Electronics |
| PolyPublie URL: | https://publications.polymtl.ca/36680/ |
| Journal Title: | IET Microwaves, Antennas & Propagation (vol. 11, no. 1) |
| Publisher: | Institution of Engineering and Technology |
| DOI: | 10.1049/iet-map.2016.0150 |
| Official URL: | https://doi.org/10.1049/iet-map.2016.0150 |
| Date Deposited: | 18 Apr 2023 15:04 |
| Last Modified: | 25 Sep 2024 16:20 |
| Cite in APA 7: | Chen, H., Che, W., Chao, Y., Feng, W., & Wu, K. (2017). Revisiting and improvement of thru-reflect-line calibration for accurate measurement of substrate integrated waveguide components. IET Microwaves, Antennas & Propagation, 11(1), 29-35. https://doi.org/10.1049/iet-map.2016.0150 |
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