<  Back to the Polytechnique Montréal portal

Influence of internal stress in optical thin films on their failure modes assessed by in situ real-time scratch analysis

Thomas Poirié, Thomas Schmitt, Étienne Bousser, Ludvik Martinu and Jolanta-Ewa Sapieha

Article (2017)

An external link is available for this item
Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/36541/
Journal Title: Tribology International (vol. 109)
Publisher: Elsevier
DOI: 10.1016/j.triboint.2016.12.053
Official URL: https://doi.org/10.1016/j.triboint.2016.12.053
Date Deposited: 18 Apr 2023 15:04
Last Modified: 05 Apr 2024 11:29
Cite in APA 7: Poirié, T., Schmitt, T., Bousser, É., Martinu, L., & Sapieha, J.-E. (2017). Influence of internal stress in optical thin films on their failure modes assessed by in situ real-time scratch analysis. Tribology International, 109, 355-366. https://doi.org/10.1016/j.triboint.2016.12.053

Statistics

Dimensions

Repository Staff Only

View Item View Item