Influence of internal stress in optical thin films on their failure modes assessed by in situ real-time scratch analysis

Thomas Poirié, Thomas Schmitt, Étienne Bousser, Ludvik Martinu, Jolanta-Ewa Sapieha

Article (2017)

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Journal Title :
Tribology International ( vol. 109 )
Publisher:
Elsevier
OAI:
oai:publications.polymtl.ca:36541
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Date Deposited:
18 Apr 2023 15:04
Last Modified:
14 Oct 2026 13:26
Cite in APA 7:
Poirié, T., Schmitt, T., Bousser, É., Martinu, L., & Sapieha, J.-E. (2017). Influence of internal stress in optical thin films on their failure modes assessed by in situ real-time scratch analysis. Tribology International, 109, 355-366. https://doi.org/10.1016/j.triboint.2016.12.053

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