Thomas Poirié, Thomas Schmitt, Étienne Bousser, Ludvik Martinu
and Jolanta-Ewa Sapieha
Article (2017)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/36541/ |
| Journal Title: | Tribology International (vol. 109) |
| Publisher: | Elsevier |
| DOI: | 10.1016/j.triboint.2016.12.053 |
| Official URL: | https://doi.org/10.1016/j.triboint.2016.12.053 |
| Date Deposited: | 18 Apr 2023 15:04 |
| Last Modified: | 25 Sep 2024 16:20 |
| Cite in APA 7: | Poirié, T., Schmitt, T., Bousser, É., Martinu, L., & Sapieha, J.-E. (2017). Influence of internal stress in optical thin films on their failure modes assessed by in situ real-time scratch analysis. Tribology International, 109, 355-366. https://doi.org/10.1016/j.triboint.2016.12.053 |
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