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Effects of online fault detection mechanisms on Probabilistic Timing Analysis

Chen Chao, Jacopo Panerati and Giovanni Beltrame

Paper (2016)

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Department: Department of Computer Engineering and Software Engineering
ISBN: 9781509036233
PolyPublie URL: https://publications.polymtl.ca/36354/
Conference Title: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2016)
Conference Location: Connecticut
Conference Date(s): 2016-09-19 - 2016-09-20
Publisher: IEEE
DOI: 10.1109/dft.2016.7684067
Official URL: https://doi.org/10.1109/dft.2016.7684067
Date Deposited: 18 Apr 2023 15:05
Last Modified: 25 Sep 2024 16:20
Cite in APA 7: Chao, C., Panerati, J., & Beltrame, G. (2016, September). Effects of online fault detection mechanisms on Probabilistic Timing Analysis [Paper]. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2016), Connecticut. https://doi.org/10.1109/dft.2016.7684067

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