H. Bouchard, A. Azelmad, John F. Currie, Michel Meunier
, S. Blain and T. Darwall
Paper (1993)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/35705/ |
| Conference Title: | 1993 MRS Spring Meeting |
| Conference Location: | San Francisco, CA |
| Conference Date(s): | 1993-04-12 - 1993-04-16 |
| Journal Title: | MRS Proceedings (vol. 308) |
| Publisher: | Materials Research Society |
| DOI: | 10.1557/proc-308-63 |
| Official URL: | https://doi.org/10.1557/proc-308-63 |
| Date Deposited: | 18 Apr 2023 15:26 |
| Last Modified: | 25 Sep 2024 16:19 |
| Cite in APA 7: | Bouchard, H., Azelmad, A., Currie, J. F., Meunier, M., Blain, S., & Darwall, T. (1993, April). Thermal Stress in Doped Silicate Glasses (B,P) Deposited by PECVD and LPCVD [Paper]. 1993 MRS Spring Meeting, San Francisco, CA. Published in MRS Proceedings, 308. https://doi.org/10.1557/proc-308-63 |
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