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Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using Si₈₀Ge₂₀ Polycrystalline Alloys

D. Vasilevskiy, J. M. Simard, T. Caillat, Rémo A. Masut and Sylvain Turenne

Article (2016)

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Department: Department of Mechanical Engineering
Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/34218/
Journal Title: Journal of Electronic Materials (vol. 45, no. 3)
Publisher: Springer
DOI: 10.1007/s11664-015-4101-1
Official URL: https://doi.org/10.1007/s11664-015-4101-1
Date Deposited: 18 Apr 2023 15:06
Last Modified: 08 Jun 2023 11:42
Cite in APA 7: Vasilevskiy, D., Simard, J. M., Caillat, T., Masut, R. A., & Turenne, S. (2016). Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using Si₈₀Ge₂₀ Polycrystalline Alloys. Journal of Electronic Materials, 45(3), 1540-1547. https://doi.org/10.1007/s11664-015-4101-1

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