Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using Si₈₀Ge₂₀ Polycrystalline Alloys

D. Vasilevskiy, J. M. Simard, T. Caillat, Rémo A. Masut and Sylvain Turenne

Article (2016)

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Department:	Department of Mechanical Engineering Department of Engineering Physics
PolyPublie URL:	https://publications.polymtl.ca/34218/
Journal Title:	Journal of Electronic Materials (vol. 45, no. 3)
Publisher:	Springer
DOI:	10.1007/s11664-015-4101-1
Official URL:	https://doi.org/10.1007/s11664-015-4101-1
Date Deposited:	18 Apr 2023 15:06
Last Modified:	25 Sep 2024 16:17

Cite in APA 7:	Vasilevskiy, D., Simard, J. M., Caillat, T., Masut, R. A., & Turenne, S. (2016). Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using Si₈₀Ge₂₀ Polycrystalline Alloys. Journal of Electronic Materials, 45(3), 1540-1547. https://doi.org/10.1007/s11664-015-4101-1
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